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  Datasheet File OCR Text:
 Bulletin I0125J 07/97
IR180LM..CS05CB SERIES
FAST RECOVERY DIODES
Junction Size: Wafer Size: VRRM Class: Passivation Process:
Square 180 mils 4" 1000 and 1200 V Glassivated MOAT
Reference IR Packaged Part: 20ETF Series
Major Ratings and Characteristics
Parameters
VFM VRRM Maximum Forward Voltage Reverse Breakdown Voltage Range
Units
1350 mV
Test Conditions
TJ = 25C, IF = 20 A
(1)
1000 and 1200 V TJ = 25C, IRRM = 100 A
(1) Nitrogen flow on die edge.
Mechanical Characteristics
Nominal Back Metal Composition, Thickness Nominal Front Metal Composition, Thickness Chip Dimensions Wafer Diameter Wafer Thickness Maximum Width of Sawing Line Reject Ink Dot Size Ink Dot Location Recommended Storage Environment Cr - Ni - Ag (1 KA - 4 KA - 6 KA) 100% Al, (20 m) 180 x 180 mils (4.57x4.57 mm) - see drawing 100 mm, with std. < 110 > flat 260 m 45 m 0.25 mm diameter minimum See drawing Storage in original container, in dessicated nitrogen, with no contamination
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1
IR180LM..CS05CB Series
Bulletin I0125J 07/97
Ordering Information Table
Device Code
IR
1 1 2 3 4 5 6 7 8 International Rectifier Device Chip Dimension in Mils
180
2
L
3
M
4
12
5
C
6
S05
7
CB
8
Type of Device: L = Wire Bondable Fast Recovery Diode Passivation Process: M = Glassivated MOAT Voltage code: Code x 100 = VRRM Metallization: C = Aluminium (Anode) - Silver (Cathode) Fast Recovery Type: S05 = 500 nsec CB = Probed Uncut Die (wafer in box)
Available Class 10 = 1000 V 12 = 1200 V
None = Probed Die in chip carrier
Outline Table
All dimensions are in microns
2
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IR180LM..CS05CB Series
Bulletin I0125J 07/97
Wafer Layout
TOP VIEW N 293 Basic Cells
All dimensions are in millimeters
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